SN74BCT8374ADW
| Part Number | SN74BCT8374ADW |
| Manufacturer | Texas Instruments |
| Category | Logic ICs |
| Description | IC SCAN TEST DEVICE W/FF 24-SOIC |
SN74BCT8374ADW Specifications
| RoHS | No RoHS Information |
| EDA/CAD Models | SN74BCT8374ADW PCB Footprint and Symbol |
| Warranty | Up to 1 year [Limited-Warranty]* |
| Brand | Texas Instruments |
| Product Line | Semiconductors |
| Subcategory | Specialty Logic |
| Series | 74BCT |
| Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| Supply Voltage | 4.5V ~ 5.5V |
| Number of Bits | 8 |
| Operating Temperature | 0°C ~ 70°C |
| Mounting Type | Surface Mount |
| Package / Case | 24-SOIC (0.295", 7.50mm Width) |
| Supplier Device Package | 24-SOIC |
Quick Inquiry
| In Stock | 449 - More on Order |
| Quote Limit | No Limit |
| Lead-Time | To be Confirmed |
| Minimum | 1 |
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