SN74LVTH182512DGGR
| Part Number | SN74LVTH182512DGGR |
| Manufacturer | Texas Instruments |
| Category | Logic ICs |
| Description | IC SCAN-TEST-DEV/XCVR 64-TSSOP |
SN74LVTH182512DGGR Specifications
| RoHS | No RoHS Information |
| EDA/CAD Models | SN74LVTH182512DGGR PCB Footprint and Symbol |
| Warranty | Up to 1 year [Limited-Warranty]* |
| Brand | Texas Instruments |
| Product Line | Semiconductors |
| Subcategory | Specialty Logic |
| Series | 74LVTH |
| Logic Type | ABT Scan Test Device With Universal Bus Transceivers |
| Supply Voltage | 2.7V ~ 3.6V |
| Number of Bits | 18 |
| Operating Temperature | -40°C ~ 85°C |
| Mounting Type | Surface Mount |
| Package / Case | 64-TFSOP (0.240", 6.10mm Width) |
| Supplier Device Package | 64-TSSOP |
Quick Inquiry
| In Stock | 274 - More on Order |
| Quote Limit | No Limit |
| Lead-Time | To be Confirmed |
| Minimum | 1 |
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